APD-Advanced Performance Detector
產品特色
BURLE Advanced Performance Long-LifeTM
Microchannel Plate Detector Applications
- Time-Of-Flight Mass Spectrometry
- Secondary lon Mass Spectrometry
- Scanning Electron Microscopy (SEM)
- E-Beam/ X-Ray Lithography
- Particle Physics
- Residual Gas Analysis
- lon Beam Profiling
- Plasma Profiling
- Semiconductor Metrology
- High Energy Physics
- Space Exploration
- https://www.photonis.com/products/mcp-based-detectors
